Quantum Design Inc.
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Quantum Design Inc.
  1. Quantum Design Europe
  2. Imaging
  3. Cameras for EUV, X-ray and high-energy particle detection
  4. CCD and sCMOS cameras for direct detection
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LOT-QuantumDesign
Our partner Oxford Instruments Andor

CCD and sCMOS cameras for direct detection

Marana-X, iKon SO and Newton SO from Oxford Instruments Andor

Besides their standard use as imaging devices CCD and sCMOS sensors are also suitable for the direct detection of VUV, EUV light and soft X-rays. For this purpose, we offer back illuminated CCD and sCMOS sensors without anti-reflection coatings and micro-lens arrays. Deep thermoelectric cooling as well as good linearity and homogeneity allow to detect even the weakest signals over long exposure times.

Features
  • Back illuminated CCD and sCMOS sensors without anti-reflection coatings
  • Pixel sizes 6.5 µm, 13 µm, 13.5 µm, 15 µm, and 26 µm
  • Thermo-electrical cooling to -100 °C for negligible dark current
  • High quality 16 and 18 bit AD converters for low readout noise
  • Flanges compatible with any vacuum port

Further information

We offer vacuum compatible CCD detectors with various sensor formats. Detection of VUV, EUV light and soft X-rays occurs by direct absorption of photons in the depletion layer of a pixel. Depending on the energy of the photon a number of electron-hole pairs is created. Excellent linearity and homogeneity ensures the quality of measurement data. CF or other type of vacuum flanges can be offered upon request. Andor X-ray cameras are used in many research labs for high energy physics around the world.

Specifications

pdf
Marana-X.pdf
3.61 MB
 Marana-X
pdf
iKon-XL_SO.pdf
2.95 MB
 iKon-XL SO 231 (4096 x 4108 x 15 µm)
pdf
iKon-M-L_SO.pdf
2.85 MB
 iKon-L SO 936 (2048 x 2048 x 13,5 µm)
pdf
Newton_SO.pdf
2.49 MB
 Newton SO 940 (2048 x 512 x 13,5 µm)

Applications

Higher harmonic generation
Soft X-rays
VUV and EUV spectroscopy
Synchrotron radiation
X-ray tomography

Downloads

Detection of high energy radiation
Detection of high energy radiation
Vacuum flanges
Vacuum flanges
Liquid cooling system EXT-440
Liquid cooling system EXT-440
Software for cameras and spectropgraphs
Software for cameras and spectropgraphs
X-ray damage
X-ray damage
Remote camera server
Remote camera server

Videos

Webinar Scientific Cameras Part 1
Webinar Scientific Cameras Part 2
The Future of Fast, High DNR Soft X Ray & EUV Detection
Remote Camera Server Online Seminar

Reference customers

Title Author(s) Institute Year Detector
Spectroscopy
Ultra-broadband spectrometry in the extreme ultraviolet (EUV) L. Bahrenberg,
S. Schröder,
S. Brose		 Chair for Technology of Optical Systems (TOS), RWTH Aachen University, Germany 2020 Newton SO DO940P-BN
A new compact soft X-ray spectrometer for RIXS studies at PETRA III Z. Yin1,2,
S. Techert1,2,3

1 FS-SCS, Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany
2 Structural Dynamics of (Bio)chemical Systems, Max Planck Institute for Biophysical Chemistry, Göttingen, Germany
3 Institute of X-ray Physics, Georg-August University, Göttingen, Germany

 2017 iKon-L SO DO936N-OZ-BN
High-harmonic radiation for seeding the swiss free electron lase J. Rauschenberger1, C. Hauri2 1H+P SPECTROSCOPY,
Dr. Hoerlein +
Partner GbR,
Mannheim, Germany, 2Paul Scherrer Institut,
Villigen, Switzerland 		2016 Newton SO DO940P-BN
Investigation of spin dynamics in Ni-Pd alloys
using extreme ultraviolet radiation		 S. Gang,
R. Adam,
M. Plötzing,
C. M. Schneider		 Peter Grünberg Institut (PGI-6), Forschungszentrum Jülich GmbH, JARA, Jülich, Germany 2016 Newton SO DO920P-BEN
Compact soft x-ray spectrometer for laser-matter studies R. Irsig Institute of Physics, University of Rostock, Germany 2012


Newton SO DO940P-BN
Warm dense matter analysis P. Neumayer,
D. Hochhaus et al.		 GSI, Darmstadt, Germany 2012

iKon-M SO DO934P-BN
DX420-BN
Element-selective ultrafast magnetization dynamics D. Rudolf1,
Chan La-O-Vorakiat2,
E. Turgut2,
P. Grychtol1,4,
R. Adam1,
S. Mathias4,
J. M. Shaw3,
H. T. Nembach3,
T. J. Silva 3,
M. Aeschlimann4,
C. M. Schneider1,
M. M. Murnane2,
H. C. Kapteyn2		 1Peter Grünberg Institute (PGI-6), Forschungszentrum Jülich, Germany
2Department of Physics and JILA, University of Colorado, Boulder, USA
3Electromagnetics Division, National Institute of Standards and Technology, Boulder, USA
4University of Kaiserslautern and Research Center OPTIMAS, Kaiserslautern, Germany		 2012

iKon-L SO DO936N-MW-BN
Table-top coherent x-ray-source from mid-infrared high power laser interaction with gases T. Popmintchev1,
M.-C. Chen1,
D. Popmintchev1,
S. Ališauskas2,
G. Andriukaitis2,
T. Balčiūnas2,
A. Pugžlys2,
A. Baltuška2,
M. Murnane1,
H. Kapteyn1		 1  JILA, University of Colorado, Boulder, USA
2  Photonics Institute, Vienna University of Technology, Austria		 2011

Newton SO DO920N-BN
Monochromatizing a femtosecond high-order harmonic VUV photon source with reflective off-axis zone plates M. Ibek,
T. Leitner,
P. Wernet,
A. Firsov,
A. Erko		 Methods and Instrumentation for Synchrotron Radiation Research and Nanometer Optics and Technology, Helmholtz Center Berlin for Materials and Energy, Germany 2011

iKon-L SO DO936N-MW-BN
Sample analysis with a grazing incidence XUV reflectometer S. Brose,
M. Banyay,
L. Juschkin,
S. Danylyuk		 Chair for the Technology of Optical Systems, RWTH Aachen, Germany 2011

DX440-BN2
Single event spectroscopy on laser generated x-ray beams C. Kern,
M. Schnell,
C. Spielmann		 Institute of Optics and Quantum Electronics, University of Jena, Germany 2010

iKon-L SO DO936N-MW-BN
Spectral and spatial characterization of harmonics in the XUV region S. Eyring,
C. Kern,
J. Lohbreier,
R. Spitzenpfeil,
C. Spielmann		 Institute of Optics and Quantum Electronics, University of Jena, Germany 2009

DO420-BN1
A calibrated compact soft X-Ray spectrometer H. Stiel,
H. Legall		 Max Born Institute of Nonlinear Optics and Ultrafast Spectroscopy, Berlin, Germany 2009

iDus SO DO420A-BN3
Time resolved X-Ray diffraction I. Uschmann Institute of Optics and Quantumelectronics, University of Jena, Germany 2007

DX420-BR-DD2
Laserartige  XUV-Strahlung:
Charakterisierung und Handhabung von Gasharmonischen		 A. Klein,
D. Hemmers,
G. Pretzler		 Institute of Laser- and Plasmaphysics, University of Düsseldorf, Germany 2006

DO420-BN1
Characterization of light sources
High-harmonic radiation for seeding the swiss free electron lase J. Rauschenberger1, C. Hauri2 1H+P SPECTROSCOPY,
Dr. Hoerlein +
Partner GbR,
Mannheim, Germany, 2Paul Scherrer Institut,
Villigen, Switzerland 		2016 Newton DO940P-BN
Spatial characterization of a discharge based radiation K. Bergmann,
J. Vieker		 Fraunhofer Institute for Laser Technology, Aachen, Germany 2013

iKon-M SO DO934P-BN
Table-top coherent x-ray-source from mid-infrared high power laser interaction with gases T. Popmintchev1,
M.-C. Chen1,
D. Popmintchev1,
S. Ališauskas2,
G. Andriukaitis2,
T. Balčiūnas2,
A. Pugžlys2,
A. Baltuška2,
M. Murnane1,
H. Kapteyn1		 1  JILA, University of Colorado, Boulder, USA
2  Photonics Institute, Vienna University of Technology, Austria		 2011

Newton SO DO920N-BN
Monochromatizing a femtosecond high-order harmonic VUV photon source with reflective off-axis zone plates M. Ibek,
T. Leitner,
P. Wernet,
A. Firsov,
A. Erko		 Methods and Instrumentation for Synchrotron Radiation Research and Nanometer Optics and Technology, Helmholtz Center Berlin for Materials and Energy, Germany 2011

iKon-L SO DO936N-MW-BN
Single event spectroscopy on laser generated x-ray beams C. Kern,
M. Schnell,
C. Spielmann		 Institute of Optics and Quantum Electronics, University of Jena, Germany 2010

iKon-L SO DO936N-MW-BN
Spectral and spatial characterization of harmonics in the XUV region S. Eyring,
C. Kern,
J. Lohbreier,
R. Spitzenpfeil,
C. Spielmann		 Institute of Optics and Quantum Electronics, University of Jena, Germany 2009

DO420-BN1
Time resolved X-Ray diffraction I. Uschmann Institute of Optics and Quantumelectronics, University of Jena, Germany 2007

DX420-BR-DD2
Laserartige  XUV-Strahlung:
Charakterisierung und Handhabung von Gasharmonischen		 A. Klein,
D. Hemmers,
G. Pretzler		 Institute of Laser- and Plasmaphysics, University of Düsseldorf, Germany 2006

DO420-BN1
Small angle scattering using XUV light from high-order harmonic generation Ch. Weier,
R. Adam,
C. M. Schneider		 Peter Grünberg Institute, Forschungszentrum Jülich GmbH, Germany 2014

Newton SO DO920P-BN
Microscopy
Soft x-ray microscopy using a table-top laser-induced plasma source based on a pulsed gas jet M. Müller,
K. Mann		 Laser-Laboratorium Göttingen e.V.,
Optics / Short Wavelengths		 2017 iKon-L SO DO936N-OW-BN
Coherent microscopy with soft X-rays R. Heine,
A. Rosenhahn		 Institute of Functional Interfaces, Karlsruhe Institute of Technology, Karlsruhe,  and Institute of Applied Physical Chemistry, University of Heidelberg, Germany 2010

DODX436-BN2
Scattering
Small angle scattering using XUV light from high-order harmonic generation Ch. Weier,
R. Adam,
C. M. Schneider		 Peter Grünberg Institute, Forschungszentrum Jülich GmbH, Germany 2014

Newton SO DO920P-BN
Coherent X-ray scattering experiments at the coherence beamline P10 at PETRA III L. Müller,
F. Westermeier,
M. Sprung		 Coherent X-Ray Scattering, DESY, Hamburg, Germany 2013

iKon-L SO DO936N-MW-BR-DD
Time-resolved resonant soft x-ray scattering
with free-electron lasers		 W. Schlotter1,
F. Sorgenfrei2,
M. Beye3,
W. Wurth2		 1Stanford Linear Accelerator Center, Menlo Park, USA
2Institute for Experimental Physics and Center for Free-Electron Laser Science, University of Hamburg, Germany
3  Helmholtz Centre for Materials and Energy, Berlin, Germany		 2011

iKon-L SO DO936N-MW-BN
Coherent diffraction imaging
Tabletop coherent diffractive imaging with a gas-discharge extreme ultraviolet light source L. Juschkin1,2,
J. Bußmann1,2,
L. Loetgering1,
D. Rudolf1,2, S. Brose3,
S. Danylyuk3,
R. Xu4,
J. Miao4		 1Experimental Physics of EUV, RWTH Aachen University, JARA-FIT, Aachen, Germany
2Peter Grünberg Institut (PGI-9), Forschungszentrum Jülich GmbH, JARA-FIT, Jülich, Germany
3Chair for Technology of Optical Systems, RWTH Aachen University, JARA-FIT, Aachen, Germany
4Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, USA		 2014

iKon-M SO DO934P-BN
Lensless coherence diffraction imaging with an ultra- narrowband laser-based extreme-ultraviolet source S. Witte,
V. T. Tenner,
D. W. E. Noom,
K. S. E. Eikema		 Institute for Lasers, Life and Biophotonics (LaserLaB), VU University Amsterdam, The Netherlands 2014

iKon-M SO DO934P-BN
Phase-contrast imaging
Quantitative X-Ray phase imaging of impact damaged carbon-fiber-reinforced polymers M. Hildebrand, M. Leck,
M. Korth		 Department of Analytical Measurement Technology, University of Applied Sciences and Arts, Göttingen, Germany 2013

iKon-M SO DO934P-BR-DD
Interferometry
XUV Interferometry using thin-film beam splitters U. Zastrau1,
V. Hilbert1,
M. Wünsche1,
S. Zhang1,
C. Rödel1,2,
E. Förster 2		 1Institute of Optics and Quantum Electronics, University of Jena, Germany
2Helmholtz Institute Jena, Germany		 2012

iKon-L SO DO936N-MZ-BN
Interferometry in the XUV spectral range using laser- generated high-order harmonics D. Hemmers,
G. Pretzler		 Institute of Functional Interfaces, Karlsruhe Institute of Technology, Karlsruhe,  and Institute of Applied Physical Chemistry, University of Heidelberg, Germany 2006

DO420-BN1

Remarks:
1DO420 replaced by Newton SO 920
2not available any more
3iDus SO replaced by Newton SO

Videos about Frequently Asked Questions

Contact

Christian Iser
Christian Iser
Schleswig-Holstein, Hamburg, Bremen, Niedersachsen, Nordrhein-Westfalen, Mecklenburg-Vorpommern
Jennifer Kraus
Jennifer Kraus
Berlin, Brandenburg, Sachsen-Anhalt, Sachsen, Thueringen, Hessen, Rheinland-Pfalz, Saarland
Markus Krause
Markus Krause
Berlin, Brandenburg, Sachsen-Anhalt, Sachsen, Thueringen, Hessen, Rheinland-Pfalz, Saarland
Dr. Thorsten Pieper
Dr. Thorsten Pieper
Bavaria, Baden-Wuerttemberg, Austria

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Quantum Design GmbH

Breitwieserweg 9
64319 Pfungstadt
Germany

Phone:+49 6157 80710-0
Fax:+49 6157 807109
E-mail:germanyqd-europe.com
Christian IserProduct Manager Imaging & Spectroscopy
+49 6157 80710-690
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Jennifer KrausProduct Manager Imaging & Spectroscopy
+49 6157 80710-692
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Markus KrauseProduct Manager Andor
+49 6157 80710-558
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Dr. Thorsten PieperProduct Manager Imaging & Spectroscopy
+49 6157 80710-754
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