Energy and time-resolved event detectors

AdvaPix and MiniPix from Advacam

The AdvaPIX and MiniPIX series from Advacam are based on the Timepix technology developed at CERN. They are high-resolution detectors for spectral X-ray imaging, optimized for applications in research, medicine, material analysis, and radiation detection.

The sensors provide a spatial resolution of 256 × 256 pixels and cover energy ranges starting from 3 keV. Both systems use USB interfaces and feature TTL I/Os for flexible control.

Users can choose between Si and CdTe sensors. The combination of CdTe and advanced data analysis even enables subpixel resolution down to 15 µm and an impressive time resolution of 1.6 ns – ideal for fast, precise X-ray imaging and particle tracking.

MiniPIX: Compact, portable, ideal for education, research, and radiation monitoring.

AdvaPIX: More powerful, modularly expandable, suitable for complex, dynamic imaging methods (e.g. ToF, Compton camera, SAXS, XRD, etc.).

The AdvaPIX detector is also a highly customizable and versatile device. For example, it can be equipped with a central sensor opening or operated as the AdvaPIX Quad, with four Timepix3 chips synchronized via a single USB interface.

Features
  • Timepix2 or Timepix3 technology
  • Event detector
  • Pixel size 55 µm
  • Recording of position, energy, time-of-arrival
  • up to 40 MHz readout

Further information

  AdvaPIX TPX3 MiniPIX TPX3 MiniPIX SPRINTER
Readout chip Timepix3 Timepix3 Timepix2 (new generation)
Sensor material Si or CdTe Si or CdTe Si
Sensor thickness 100 / 300 / 500 µm (Si)
1000 µm (CdTe)
100 / 300 / 500 µm (Si)
1000 µm (CdTe)
100 / 300 / 500 µm
Number of pixels 256 × 256 (expandable) 256 × 256 256 × 256
Pixel pitch 55 µm 55 µm 55 µm
Sensitive area 14 mm × 14 mm 14 mm × 14 mm 14 mm × 14 mm
Count rate / Frame rate 38 million hits/s 2.35 million hits/s 99 fps
Time resolution 1.6 ns 1.6 ns
Energy resolution 1 keV 1.2–3.6 keV (Si)
2.8–8.3 keV (CdTe)
0.4-2.0 keV
Min. detectable energy 3 keV for X-rays 3 keV (Si)
5 keV (CdTe)
5 keV
Interface USB 3.0 (Super-Speed) µUSB 2.0

µUSB 2.0 (Full-Speed)

Applications

Radiography
X-ray diffraction
Radiation monitoring
Synchrotron radiation
SAXS and WAXS
Time-of-flight imaging
Non-destructive testing
Geology
Authentication
XRF

Downloads

AdvaPIX TPX3
MiniPIX Sprinter
MiniPIX
MiniPIX EDU
MiniPIX TPX3 Flex
MiniPIX TPX3
MiniPIX TPX3 Space

Contact

Jennifer Kraus
Jennifer Kraus

Contact

Quantum Design GmbH

Breitwieserweg 9
64319 Pfungstadt
Germany

Phone:+49 6157 80710-0
E-mail:germanyqd-europe.com
Jennifer KrausProduct Manager Imaging & Spectroscopy
+49 6157 80710-692
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