LOT-QuantumDesign
Our partner Deben

In situ tensile stage CT500 500N for µXCT applications

from Deben

In-situ testing stages from Deben are very useful tools to enhance the capabilities of µCT-systems with respect to 4D-experiements. Samples can be analyzed under certain loads or different temperature conditions without the drawback to remove the samples out of the CT-system.

Features
  • Weight < 1 kg
  • Compatible with µCT-systems
  • Modular tensile & compression testing system
  • Possibility to customized tensile jaws and compression platens

Further information

The CT500 in-situ tensile stage is compatible with most CT-systems on the market (e.g. Zeiss, Nikon, GE). The comprehensive MICROTEST control software is used for a wide range of control functions. All in-situ test stages will be supplied with the required cabling and mounting adaptors for the specific CT-system.

Specifications

CT500 general specifications:

  • Modular tensile & compression testing system to be installed within a µXCT system
  • Tensile jaws and compression platens, (can be customised to customer specifications)
  • Mounting plate for fitting onto existing rotary table, with slot for cable exit through centre or side
  • Precision slides & leadscrew
  • Maximum load reading resolution, 1000:1 dynamic, 2000:1 static (of full scale range)
  • MICROTEST drive electronics and Windows™ software providing comprehensive USB2 control of the tensile stage
  • A PC is required to drive this system: minimum specification Dual core 2 Ghz with Windows™ XP/7.0 /8.0 Professional, 2 Gb RAM, CD ROM and one free USB2 port
  • Operating voltage 230 V/115 V
  • Simple specimen exchange mechanism with ULTEM polymer support tube, 1.5 mm wall thickness (3.0 mm in beam path)
  • Maximum extension 10 mm (stroke can be set depending on customer requirements, default is (10-20 mm tensile), (15-5 mm compression) with compression platens fitted
  • Fixed load cell with accuracy, 1% of full scale range, choice of 50 N, 200 N or 500 N (load cell is not user exchangeable)
  • 10 mm linear extensometer for position readout, resolution 3 μm, linearity 0.1% of full scale
  • Fast gearbox with speed range 0.1 mm/min to 1.0 mm/min
  • Optical encoder fitted to motor giving speed control accuracy better than 5%
  • Size: 87 mm diameter, 86 mm to bottom of tube, tube length to suit X-Ray source
  • Stage weight:  ~ 1.0 kg

CT500 options:

  • 3 & 4 point bending clamps
  • Custom jaws and specimen mounts for large or small specimens

Downloads

In situ testing stages for XRM/µXCT
Using CT500 application note

Contact

Dr. Andreas Bergner
Dr. Andreas Bergner

Contact

Quantum Design GmbH

Breitwieserweg 9
64319 Pfungstadt
Germany

Phone:+49 6157 80710-0
Fax:+49 6157 807109
E-mail:germanyqd-europe.com
Dr. Andreas BergnerProduct Manager - Electron microscopy & nanotechnology
+49 6157 80710-12
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