LOT-QuantumDesign
Our partner Andor Oxford Instruments

CCD and sCMOS cameras for direct detection

Marana-X, iKon SO and Newton SO from Andor Technology

Besides their standard use as imaging devices CCD and sCMOS sensors are also suitable for the direct detection of VUV, EUV light and soft X-rays. For this purpose, we offer back illuminated CCD and sCMOS sensors without anti-reflection coatings and micro-lens arrays. Deep thermoelectric cooling as well as good linearity and homogeneity allow to detect even the weakest signals over long exposure times.

Features
  • Back illuminated CCD and sCMOS sensors without anti-reflection coatings
  • Pixel sizes 6.5 µm, 13 µm, 13.5 µm, 15 µm, and 26 µm
  • Thermo-electrical cooling to -100 °C for negligible dark current
  • High quality 16 and 18 bit AD converters for low readout noise
  • Flanges compatible with any vacuum port

Further information

We offer vacuum compatible CCD detectors with various sensor formats. Detection of VUV, EUV light and soft X-rays occurs by direct absorption of photons in the depletion layer of a pixel. Depending on the energy of the photon a number of electron-hole pairs is created. Excellent linearity and homogeneity ensures the quality of measurement data. CF or other type of vacuum flanges can be offered upon request. Andor X-ray cameras are used in many research labs for high energy physics around the world.

Specifications

pdf
iKon-XL_SO.pdf
2.70 MB
iKon-XL SO 231 (4096 x 4108 x 15 µm)
pdf
iKon-M-L_SO.pdf
4.91 MB
iKon-L SO 936 (2048 x 2048 x 13,5 µm)
pdf
Newton_SO.pdf
2.37 MB
Newton SO 940 (2048 x 512 x 13,5 µm)

Applications

Higher harmonic generation
Soft X-rays
VUV and EUV spectroscopy
Synchrotron radiation
X-ray tomography

Downloads

Detection of high energy radiation
Vacuum flanges
Liquid cooling system EXT-440
Software for Andor cameras and spectropgraphs
X-ray damage
Remote camera server

Videos

Webinar Scientific Cameras Part 1
Webinar Scientific Cameras Part 2
The Future of Fast, High DNR Soft X Ray & EUV Detection
Remote Camera Server Online Seminar

Reference customers

Title Author(s) Institute Year Detector
Spectroscopy
Ultra-broadband spectrometry in the extreme ultraviolet (EUV) L. Bahrenberg,
S. Schröder,
S. Brose
Chair for Technology of Optical Systems (TOS), RWTH Aachen University, Germany 2020 Newton SO DO940P-BN
A new compact soft X-ray spectrometer for RIXS studies at PETRA III Z. Yin1,2,
S. Techert1,2,3

1 FS-SCS, Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany
2 Structural Dynamics of (Bio)chemical Systems, Max Planck Institute for Biophysical Chemistry, Göttingen, Germany
3 Institute of X-ray Physics, Georg-August University, Göttingen, Germany

2017 iKon-L SO DO936N-OZ-BN
High-harmonic radiation for seeding the swiss free electron lase J. Rauschenberger1, C. Hauri2 1H+P SPECTROSCOPY,
Dr. Hoerlein +
Partner GbR,
Mannheim, Germany, 2Paul Scherrer Institut,
Villigen, Switzerland
2016 Newton SO DO940P-BN
Investigation of spin dynamics in Ni-Pd alloys
using extreme ultraviolet radiation
S. Gang,
R. Adam,
M. Plötzing,
C. M. Schneider
Peter Grünberg Institut (PGI-6), Forschungszentrum Jülich GmbH, JARA, Jülich, Germany 2016 Newton SO DO920P-BEN
Compact soft x-ray spectrometer for laser-matter studies R. Irsig Institute of Physics, University of Rostock, Germany 2012


Newton SO DO940P-BN

Warm dense matter analysis P. Neumayer,
D. Hochhaus et al.
GSI, Darmstadt, Germany 2012

iKon-M SO DO934P-BN
DX420-BN

Element-selective ultrafast magnetization dynamics D. Rudolf1,
Chan La-O-Vorakiat2,
E. Turgut2,
P. Grychtol1,4,
R. Adam1,
S. Mathias4,
J. M. Shaw3,
H. T. Nembach3,
T. J. Silva 3,
M. Aeschlimann4,
C. M. Schneider1,
M. M. Murnane2,
H. C. Kapteyn2
1Peter Grünberg Institute (PGI-6), Forschungszentrum Jülich, Germany
2Department of Physics and JILA, University of Colorado, Boulder, USA
3Electromagnetics Division, National Institute of Standards and Technology, Boulder, USA
4University of Kaiserslautern and Research Center OPTIMAS, Kaiserslautern, Germany
2012

iKon-L SO DO936N-MW-BN

Table-top coherent x-ray-source from mid-infrared high power laser interaction with gases T. Popmintchev1,
M.-C. Chen1,
D. Popmintchev1,
S. Ališauskas2,
G. Andriukaitis2,
T. Balčiūnas2,
A. Pugžlys2,
A. Baltuška2,
M. Murnane1,
H. Kapteyn1
1  JILA, University of Colorado, Boulder, USA
2  Photonics Institute, Vienna University of Technology, Austria
2011

Newton SO DO920N-BN

Monochromatizing a femtosecond high-order harmonic VUV photon source with reflective off-axis zone plates M. Ibek,
T. Leitner,
P. Wernet,
A. Firsov,
A. Erko
Methods and Instrumentation for Synchrotron Radiation Research and Nanometer Optics and Technology, Helmholtz Center Berlin for Materials and Energy, Germany 2011

iKon-L SO DO936N-MW-BN

Sample analysis with a grazing incidence XUV reflectometer S. Brose,
M. Banyay,
L. Juschkin,
S. Danylyuk
Chair for the Technology of Optical Systems, RWTH Aachen, Germany 2011

DX440-BN2

Single event spectroscopy on laser generated x-ray beams C. Kern,
M. Schnell,
C. Spielmann
Institute of Optics and Quantum Electronics, University of Jena, Germany 2010

iKon-L SO DO936N-MW-BN

Spectral and spatial characterization of harmonics in the XUV region S. Eyring,
C. Kern,
J. Lohbreier,
R. Spitzenpfeil,
C. Spielmann
Institute of Optics and Quantum Electronics, University of Jena, Germany 2009

DO420-BN1

A calibrated compact soft X-Ray spectrometer H. Stiel,
H. Legall
Max Born Institute of Nonlinear Optics and Ultrafast Spectroscopy, Berlin, Germany 2009

iDus SO DO420A-BN3

Time resolved X-Ray diffraction I. Uschmann Institute of Optics and Quantumelectronics, University of Jena, Germany 2007

DX420-BR-DD2

Laserartige  XUV-Strahlung:
Charakterisierung und Handhabung von Gasharmonischen
A. Klein,
D. Hemmers,
G. Pretzler
Institute of Laser- and Plasmaphysics, University of Düsseldorf, Germany 2006

DO420-BN1

Characterization of light sources
High-harmonic radiation for seeding the swiss free electron lase J. Rauschenberger1, C. Hauri2 1H+P SPECTROSCOPY,
Dr. Hoerlein +
Partner GbR,
Mannheim, Germany, 2Paul Scherrer Institut,
Villigen, Switzerland
2016 Newton DO940P-BN
Spatial characterization of a discharge based radiation K. Bergmann,
J. Vieker
Fraunhofer Institute for Laser Technology, Aachen, Germany 2013

iKon-M SO DO934P-BN

Table-top coherent x-ray-source from mid-infrared high power laser interaction with gases T. Popmintchev1,
M.-C. Chen1,
D. Popmintchev1,
S. Ališauskas2,
G. Andriukaitis2,
T. Balčiūnas2,
A. Pugžlys2,
A. Baltuška2,
M. Murnane1,
H. Kapteyn1
1  JILA, University of Colorado, Boulder, USA
2  Photonics Institute, Vienna University of Technology, Austria
2011

Newton SO DO920N-BN

Monochromatizing a femtosecond high-order harmonic VUV photon source with reflective off-axis zone plates M. Ibek,
T. Leitner,
P. Wernet,
A. Firsov,
A. Erko
Methods and Instrumentation for Synchrotron Radiation Research and Nanometer Optics and Technology, Helmholtz Center Berlin for Materials and Energy, Germany 2011

iKon-L SO DO936N-MW-BN

Single event spectroscopy on laser generated x-ray beams C. Kern,
M. Schnell,
C. Spielmann
Institute of Optics and Quantum Electronics, University of Jena, Germany 2010

iKon-L SO DO936N-MW-BN

Spectral and spatial characterization of harmonics in the XUV region S. Eyring,
C. Kern,
J. Lohbreier,
R. Spitzenpfeil,
C. Spielmann
Institute of Optics and Quantum Electronics, University of Jena, Germany 2009

DO420-BN1

Time resolved X-Ray diffraction I. Uschmann Institute of Optics and Quantumelectronics, University of Jena, Germany 2007

DX420-BR-DD2

Laserartige  XUV-Strahlung:
Charakterisierung und Handhabung von Gasharmonischen
A. Klein,
D. Hemmers,
G. Pretzler
Institute of Laser- and Plasmaphysics, University of Düsseldorf, Germany 2006

DO420-BN1

Small angle scattering using XUV light from high-order harmonic generation Ch. Weier,
R. Adam,
C. M. Schneider
Peter Grünberg Institute, Forschungszentrum Jülich GmbH, Germany 2014

Newton SO DO920P-BN

Microscopy
Soft x-ray microscopy using a table-top laser-induced plasma source based on a pulsed gas jet M. Müller,
K. Mann
Laser-Laboratorium Göttingen e.V.,
Optics / Short Wavelengths
2017 iKon-L SO DO936N-OW-BN
Coherent microscopy with soft X-rays R. Heine,
A. Rosenhahn
Institute of Functional Interfaces, Karlsruhe Institute of Technology, Karlsruhe,  and Institute of Applied Physical Chemistry, University of Heidelberg, Germany 2010

DODX436-BN2

Scattering
Small angle scattering using XUV light from high-order harmonic generation Ch. Weier,
R. Adam,
C. M. Schneider
Peter Grünberg Institute, Forschungszentrum Jülich GmbH, Germany 2014

Newton SO DO920P-BN

Coherent X-ray scattering experiments at the coherence beamline P10 at PETRA III L. Müller,
F. Westermeier,
M. Sprung
Coherent X-Ray Scattering, DESY, Hamburg, Germany 2013

iKon-L SO DO936N-MW-BR-DD

Time-resolved resonant soft x-ray scattering
with free-electron lasers
W. Schlotter1,
F. Sorgenfrei2,
M. Beye3,
W. Wurth2
1Stanford Linear Accelerator Center, Menlo Park, USA
2Institute for Experimental Physics and Center for Free-Electron Laser Science, University of Hamburg, Germany
3  Helmholtz Centre for Materials and Energy, Berlin, Germany
2011

iKon-L SO DO936N-MW-BN

Coherent diffraction imaging
Tabletop coherent diffractive imaging with a gas-discharge extreme ultraviolet light source L. Juschkin1,2,
J. Bußmann1,2,
L. Loetgering1,
D. Rudolf1,2, S. Brose3,
S. Danylyuk3,
R. Xu4,
J. Miao4
1Experimental Physics of EUV, RWTH Aachen University, JARA-FIT, Aachen, Germany
2Peter Grünberg Institut (PGI-9), Forschungszentrum Jülich GmbH, JARA-FIT, Jülich, Germany
3Chair for Technology of Optical Systems, RWTH Aachen University, JARA-FIT, Aachen, Germany
4Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, USA
2014

iKon-M SO DO934P-BN

Lensless coherence diffraction imaging with an ultra- narrowband laser-based extreme-ultraviolet source S. Witte,
V. T. Tenner,
D. W. E. Noom,
K. S. E. Eikema
Institute for Lasers, Life and Biophotonics (LaserLaB), VU University Amsterdam, The Netherlands 2014

iKon-M SO DO934P-BN

Phase-contrast imaging
Quantitative X-Ray phase imaging of impact damaged carbon-fiber-reinforced polymers M. Hildebrand, M. Leck,
M. Korth
Department of Analytical Measurement Technology, University of Applied Sciences and Arts, Göttingen, Germany 2013

iKon-M SO DO934P-BR-DD

Interferometry
XUV Interferometry using thin-film beam splitters U. Zastrau1,
V. Hilbert1,
M. Wünsche1,
S. Zhang1,
C. Rödel1,2,
E. Förster 2
1Institute of Optics and Quantum Electronics, University of Jena, Germany
2Helmholtz Institute Jena, Germany
2012

iKon-L SO DO936N-MZ-BN

Interferometry in the XUV spectral range using laser- generated high-order harmonics D. Hemmers,
G. Pretzler
Institute of Functional Interfaces, Karlsruhe Institute of Technology, Karlsruhe,  and Institute of Applied Physical Chemistry, University of Heidelberg, Germany 2006

DO420-BN1

Remarks:
1DO420 replaced by Newton SO 920
2not available any more
3iDus SO replaced by Newton SO

Contact

Christian Iser
Christian Iser
Schleswig-Holstein, Hamburg, Bremen, Niedersachsen, Nordrhein-Westfalen, Mecklenburg-Vorpommern
Markus Krause
Markus Krause
Berlin, Brandenburg, Sachsen-Anhalt, Sachsen, Thueringen, Hessen, Rheinland-Pfalz, Saarland
Dr. Thorsten Pieper
Dr. Thorsten Pieper
Bavaria, Baden-Wuerttemberg, Austria

Contact

Quantum Design GmbH

Breitwieserweg 9
64319 Pfungstadt
Germany

Phone:+49 6157 80710-0
Fax:+49 6157 807109
E-mail:germanyqd-europe.com
Christian IserProduct Manager Andor
+49 6157 80710-690
Write e-mail

Markus KrauseProduct Manager Andor
+49 6157 80710-558
Write e-mail

Dr. Thorsten PieperProduct Manager Andor
+49 6157 80710-754
Write e-mail