Tabletop SEM TM4000 series
from Hitachi High-TechThe scanning electron microscope series TM4000 reveals ease to use, small footprint and low requirements to the environment. For image acquisition users can use a 4-quadrant backscattered electron detector and a low-vacuum SE detector. Images can be mixed (BSE + SE). The instruments are equipped with a pre-centered tungsten filament cartridge – changeable and adjustable within minutes. Easy maintenance can be done by users on-site (aperture cleaning or substitution). The SEM TM4000 series offers 5 – 20 kV acceleration voltages and is therefore ready for complete EDX analysis. The user interface is well sorted and easy-to-use. The software enables a huge variety of auto functions: Brightness, contrast, focus, reports, storing of images and parameters, stage position. The OEM Windows 10 guarantees an easy implementation into the network.
- 4-quadrant-backscattered electron detector (BSE) and Everhart Thornley secondary electron detector (SE-) including BSE + SE Mixing
- Low-vacuum mode for analysis of non-conductive samples (ChargeUp Reduction Mode)
- Pre-centered cartridge tungsten filament, operation with acceleration voltages between 5 and 20 kV, magnification up to 250.000x
- Sample sizes to 80 mm (diameter) and 50 mm (height)
- EDX systems by Bruker (Quantax 75), Oxford (Aztec series) und EDAX (Elements)
- Options STEM, Stage, Stitching, Navcam,…
Hitachi TM4000Plus - a complete new machine in stock for sale
Further information
Installation of the systems is done within minutes whereas almost no requirements to the environment are desired: 230 V power sockets, table and 60 – 90 min time – the system is ready for the first image. The pre-vacuum pump is oil-free.
The TM4000 series is available in the following configurations:
- TM4000II and TM4000-Mot II (BSE and manual or motorized stage)
- TM4000Plus II and TM4000Plus-Mot II (BSE, SE and manual or motorized stage)
TM4000 can be enhanced with:
- EDX by Bruker, Oxford or EDAX
- Navigation camera
- Image stitching
- 3D roughness measurements (certified)
- STEM detector
Further options:
- Anti-vibration table
- All systems are completed by a starter package of sample preparation tools
- Specifications and further options refer to contact mentioned below
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| +49 6157 80710-557 | |
| +49 6157 807109557 | |
| Write e-mail |
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Quantum Design GmbH
Breitwieserweg 9
64319 Pfungstadt
Germany
| Phone: | +49 6157 80710-0 |
| Fax: | +49 6157 807109 |
| E-mail: | germanyqd-europe.com |
