LOT-QuantumDesign
Our partner Nanosurf

Automated atomic force microscope for industry

NaniteAFM from Nanosurf

The unparalleled small footprint of the NaniteAFM scan head makes it the ideal atomic force microscope for integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures. Simple handling and a multitude of integration possibilities bring your product analyses to a whole new level. Check coatings for intended structures or irregularities, or use additional AFM measurement modes to detect features not visible in topography alone. Its ease of use and reproducibility make the NaniteAFM the perfect quality control tool for precision engineering, production process optimization, or semiconductor fabrication — just to name a few.

Features
  • Mountable
  • Compact
  • Robust
  • High resolution digital camera (simultaneous top and side view)
  • Automated measurements

Further information

Systems tailored to your needs

In addition to our standard products for research, industry, and nanoeducation, we now offer a unique service that fits right in with our philosophy of being a dedicated, full-range AFM solution provider: designing and developing custom-built AFM systems, stages, and parts. A dedicated team of engineers is ready to discuss your specific application, and to design and produce the optimal solution for you: a system tailored to your exact needs and specifications.

Applications

Automated surface inspection
Quality control
Production process optimization
Semiconductor fabrication

Downloads

NaniteAFM brochure

Videos

NaniteAFM Large Custom Automated Translation Stage

Contact

Dr. Stefano Pergolini
Dr. Stefano Pergolini

Related products

AFM for nanoeducation and small samples
The NaioAFM is the ideal atomic force microscope for nanoeducation and small sample measurements. This all-in-one AFM system provides solid performance and easy handling, with a price tag and ...
AFM for optical microscopes and 3D profilometers
The Nanosurf LensAFM is an atomic force microscope that can be used as a normal objective lens on almost any optical microscope or profilometer. It greatly extends the resolution and measuring ...
Flexible research AFM for materials and life science
By advancing key technologies and system designs, Nanosurf has made the FlexAFM the most versatile and flexible research atomic force microscope ever, allowing a large variety of applications to be ...
Fast spectroscopic ellipsometer M-2000
The M-2000 ellipsometer combines highly accurate 'rotating compensator' method with fast CCD technology. This allows high speed measurements: min. 390 wavelengths in < 1 second. It is available as ...
Economic high precision table top ellipsometer alpha 2.0
Spectroscopic ellipsometer alpha 2.0 is a fast, low-cost system for measuring film thickness and optical constants. Everything is contained in an amazingly small package. It is the ideal table top ...

Contact

Quantum Design s.r.l.

Via Francesco Sapori, 27
00143 Roma
Italy

Phone:+39 06 5004204
Fax:+39 06 5010389
E-mail:italy@qd-europe.com
Dr. Stefano PergoliniProduct Manager
+39 06 5004204
Write e-mail