Atomic force microscopes (AFM)

Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic- resolution by recording the interaction forces between the surface and a sharp tip mounted on a cantilever. AFM provides spatial information parallel and perpendicular to the surface. In addition to topographic high-resolution information, local material properties such as adhesion and stiffness can ... 

Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic- resolution by recording the interaction forces between the surface and a sharp tip mounted on a cantilever. AFM provides spatial information parallel and perpendicular to the surface. In addition to topographic high-resolution information, local material properties such as adhesion and stiffness can be investigated by analyzing tip-sample interaction forces. We offer AFMs suitable for research in materials science, polymers, electrochemistry, and other applications in nano-science and engineering.

Latest updates

Tre WEBINAR su Microscopia a Forza Atomica su grandi campioni e test nanomeccanici tramite nanoindentazione e tecniche AFM

Guarda i video registrati dei tre webinar sulla Microscopia a Forza Atomica e sulla Nanoindentazione che abbiamo organizzato in collaborazione con i nostri partner Nanosurf e Micro Materials!
Atomic force microscopes (AFM) - Top-Class AFM for surface characterization from atomic resolution to wide scan ranges
Top-Class AFM for surface characterization from atomic resolution to wide scan ranges

The DriveAFM is Nanosurf’s new flagship instrument, utilizes the latest technology to deliver stable, high-end performance. It was designed to fulfill the needs of top notch research, today and in the ...


Atomic force microscopes (AFM) - Flexible research AFM for materials and life science
Flexible research AFM for materials and life science

By advancing key technologies and system designs, Nanosurf has made the FlexAFM the most versatile and flexible research atomic force microscope ever, allowing a large variety of applications to be ...


Atomic force microscopes (AFM) - The best value research AFM
The best value research AFM

The CoreAFM is the result of intelligently combining the core components of AFM to achieve maximum versatility and user-friendliness. Due to this fundamental design approach, the CoreAFM is equipped ...


Atomic force microscopes (AFM) - AFM for optical microscopes and 3D profilometers
AFM for optical microscopes and 3D profilometers

The Nanosurf LensAFM is an atomic force microscope that can be used as a normal objective lens on almost any optical microscope or profilometer. It greatly extends the resolution and measuring ...


Atomic force microscopes (AFM) - Automated atomic force microscope for industry
Automated atomic force microscope for industry

The unparalleled small footprint of the NaniteAFM scan head makes it the ideal atomic force microscope for integration into automated industrial environments. With a resolution below one nanometer, ...


Atomic force microscopes (AFM) - AFM for nanoeducation and small samples
AFM for nanoeducation and small samples

The NaioAFM is the ideal atomic force microscope for nanoeducation and small sample measurements. This all-in-one AFM system provides solid performance and easy handling, with a price tag and ...


Atomic force microscopes (AFM) - Single-cell analysis and manipulation
Single-cell analysis and manipulation

A multifunctional tool for single-cell biology, tissue engineering, nanopatterning and nanolithography Fluid force microscopy combines the unique possibilities of nanofluidics with the positional ...


Atomic force microscopes (AFM) - Nanoscale surface characterization system
Nanoscale surface characterization system

The WITec atomic force microscope (AFM) alpha300 A is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope which provides superior optical access, easy ...


Atomic force microscopes (AFM) - Chemical and nanoscale imaging system
Chemical and nanoscale imaging system

The well-established Raman-atomic force microscope (AFM) combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument ...


Atomic force microscopes (AFM) - Raman, AFM and SNOM all-in-one system
Raman, AFM and SNOM all-in-one system

The unprecedented all-in-one alpha300 RAS combines Raman, AFM, and SNOM imaging in a single instrument for the utmost flexibility and sophisticated sample characterization. By combining the imaging ...

Contact

Quantum Design s.r.l.

Via Francesco Sapori, 27
00143 Roma
Italy

Phone:+39 06 5004204
Fax:+39 06 5010389
E-mail:italy@qd-europe.com