Easy-to-use Correlative AFM/SEM Microscopy Platform

Further information

One platform – multiple applications.

FusionScope is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques.

Featuring an innovative shared coordinate system to automatically align AFM and SEM operations for measurements and sample positioning, within a single software interface you now can easily identify your area of interest, measure your sample, and combine your imaging data in real time.

Acquire detailed Material Characterization of your samples, including structural, mechanical, electrical, and magnetic properties. Carry out high-level Quality Control of manufactured parts or perform Failure Analysis on electrical components or semiconductor devices. Easily characterize Nanostructures such as nanowires, 2D-materials, and nanoparticles. FusionScope gives you full control to locate your area of interest, position your probe, and perform a wide range of measurements.

Switch between a sub-nanometer resolution AFM and SEM imaging with a simple click of a button to extract your desired data. FusionScope is capable of most standard AFM measurement modes, including contact, dynamic, and FIRE modes. Interchangeable cantilevers easily provide advanced modes, such as Conductive AFM (C-AFM) and Magnetic Force Microscopy (MFM).

Get comprehensive information about FusionScope on https://fusionscope.com/

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